4 results
Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1645-1646
- Print publication:
- August 2015
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Effects of Evactron Plasma Cleaning on X-ray Detector Windows
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1368-1369
- Print publication:
- August 2005
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Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 900-901
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- August 2005
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A Study of the Cleaning Effectiveness of the Evactron(R) RF Plasma System on a Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 760-761
- Print publication:
- August 2005
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